McXtrace - An X-ray ray-trace simulation package

[ Identification | Description | Examples | Input parameters | Links ]

The SOLEIL_SIRIUS Instrument

SOLEIL SIRIUS beamline: Soft Interfaces and Resonant Investigation on Undulator Source

Identification

• Site: SOLEIL
• Author: FARHI Emmanuel
• Origin: SOLEIL
• Date: September 2026

Description

SIRIUS is designed for Soft Matter research (1.4 - 13 keV).
It features vertical focusing primary mirrors, a fixed-exit Si(111)
monochromator, and a deflection mirror to enable grazing incidence
measurements on liquid/solid interfaces.

Position | Element
---------|-------------------------------------------------------------
0        | Source: Undulator (U26)
14       | M1: Primary Mirror (Pd coated, vertical focusing)
16       | MDC1: 1st Crystal (Flat, Si 111)
16.01    | MDC2: 2nd Crystal (Sagittally bent, Si 111)
18       | Deflection Mirror (for grazing incidence)
30       | Sample Stage (XAS configuration)
35       | Sample Stage (SEXAFS configuration)

Examples

(Test cases in bold)

• Test: SIRIUS_E0=8 Detector: SIRIUS_def_loc_I=1.3905e+12

Input parameters

Parameters in boldface are required; the others are optional.

Name	Unit	Description	Default
SIRIUS_E0	keV	Central energy (1.4 - 13 keV)	8
SIRIUS_dE	keV	Energy spread	0.1
SIRIUS_M1_angle	mrad	Incidence angle of M1	3
SIRIUS_M2_angle	mrad	Incidence angle of M2	3
SIRIUS_def_angle	mrad	Deflection mirror tilt (for grazing incidence)	2.0
SIRIUS_sample_pos	m	Distance to sample (30 for XAS, 35 for SEXAFS)	30
SIRIUS_sample	str	Sample structure file	"LaB6.cif"
splits			10

Links

• Source code for SOLEIL_SIRIUS.instr.
• Documentation: APS_BL20.pdf

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[ Identification | Description | Examples | Input parameters | Links ]

Generated for mcxtrace 3.10.2

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Last Modified: Monday, 02-Nov-2026 22:21:09 CET